Surface Characterisation(SEM-EDX, AFM)

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Atomic Force Microscope (AFM)

Analysis Selection	Description	Form
Chemical, Biological, Material, Medical, Metal etc.	------------	Cihaz Form
Chemical, Biological, Material, Medical, Metal etc.	------------	Cihaz Form

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SEM-EDX

Analysis Selection	Description	Form
Surface Imaging	------------	Cihaz Form

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Laboratory Contact Phone : 0236 201 26 28
E-Mail : cbudefam@cbu.edu.tr